Contents

I: Introduction to Testing 1. Introduction 2. VLSI Testing Process and Test Equipment 3. Test Economics and Product Quality 4. Fault Modeling II: Text Methods 5. Logic and Fault Simulation 6. Testability Measures 7. Combinational Circuit Test generation 8. Sequential Circuit Test Generation 9. Memory Test 10. DSP-Based Analog and Mixed-Signal Test 11. Model-Based Analog and Mixed-Signal Test 12. Delay Test 13. IDDQ Test III: Design for Testability 14. Digital DFT and Scan Design 15. Built-In Self-Test 16. Boundary Scan Standard 17. Analog Test Bus Standard 18. System Test and Core-Based Design 19. The Future of Testing